+Title: Home | KLA-Tencor
Description: KLA-Tencor offers the industry's widest range of best-of-breed inspection and metrology tools -- combined with industry-leading process control expertise and best-practices know-how.
Keywords:KLA, Tencor, fab-wide, wafer, yield, management, copper, cops, damascene, defects, etch, laser confocal, laser confocal review, reticle inspection, semiconductor measurement, shrinks, spectroscopic ellipsometry, wafer defects, wafer inspection, Surface, Reticle, Mask, Inspection, Film, Measurement,
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